Design Support & Measurement Service
Leveraging our design platform and pipeline, Wave Photonics offers Photonic Integrated Circuit (PIC) design support as well as automated measurement at wafer scale
PIC Design Support
Even with a suitable PDK, designing a PIC can be challenging, especially for new material platforms or non-standard wavelengths.
Wave Photonics offers design support to help you create a PIC design suitable for fabrication.
As our goal is to support the use and adoption of our design platform, we are happy to provide all of the layout scripts and training to upskill your team so that future design updates can be done in-house.
Measurement Service
To develop state-of-the-art PDKs, Wave Photonics collects measurement data of component performance at wafer scale to enable statistical analysis and optimisation.
This high-throughput, parallelised measurement capability is available as a service for those developing PICs for applications where either there is a need to scan many circuits to pick a hero device, or where high-yield and reliable performance is required and so a large quantity of measurement data is required to allow for statistical analysis. To access this capability: